PACOGEN: Automatic Generation of Pairwise Test Configurations From Feature Models
- Authors
- A. Hervieu and A. Gotlieb
- Editors
- B. Cukic
- Status
- Published
- Publication type
- Proceedings Refereed
- Year of publication
- 2011
- Journal
- Proceedings of the IEEE 22nd International Symposium on Software Reliability Engineering (ISSRE 2011)
- Publisher
- IEEE Computer Society
- Citation key
- 8801