Test Case Minimization with Quantum Annealers
- Authors
- X. Wang, A. Muqeet, T. Yue, S. Ali and P. Arcaini
- Status
- Accepted
- Publication type
- Journal Article
- Year of publication
- 2024
- Journal
- ACM Transactions on Software Engineering and Methodology
- Publisher
- Association for Computing Machinery (ACM)
- Citation key
- 17797